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Ims5420-th Sistem za merjenje debeline waferjev - Interferometri (bela svetloba)
O tem izdelku
Obiščite stran dobaviteljevega izdelkaIMS5420 je visokozmogljiv interferometer za belo svetlobo, namenjen brezstični meritvi debeline monokristalnih silicijevih waferjev. Krmilnik ima širokopasovno superluminiscenčno diodo (SLED) z valovno dolžino 1.100 nm. To omogoča merjenje debeline nedopiranih, dopiranih in močno dopiranih SI waferjev z le enim merilnim sistemom. IMS5420 dosega stabilnost signala manjšo od 1 nm. Debelino je mogoče meriti z razdalje 24 mm.
PreverjenoMICRO-EPSILON
Koenigbacher Strasse 15, Ortenburg 94496
Nemčija
Dostava: Po vsem svetu
Ustanovljeno: 1968
Zaposleni: 1000+
Vrsta dobavitelja
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ProizvodnjaPodobni izdelki
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Podobni izdelki
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Ims5420-th Sistem za merjenje debeline waferjev - Interferometri (bela svetloba)